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KN Series for Kleindiek System
PS8140mm width platform with 8tip holders that is compatible in 6” load lock • Failure analysis
• Qualifying high gate materials
• Low current transistor testing
• Four point probing
• EBIC, EBAC, RCI, EBIV, EBIRCH, and Active Potential Contrast analysis
• Current Imaging
• Characterization of advanced materials and structures e.g. nanowires, ultra thin films
• Nanoscale assembly and manipulation Contact Us for Further Information