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    Mesoscope

    The World leading Nano-Scale Metallic Probe Maker

    Since 2010, MESOSCOPE designs and fabricates cleanness, high uniformity and leading specification for failure analysis the advanced technology Till to 2018.                   

            There are over 35 leading wafer foundries,  IC design house, Fabless companies, Failure analysis houses and academic organization qualify and use it as main source for FA.

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    SA025 for SEM based Nano probing System

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    MS060 for Hitachi SEM Based Nano probing

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    FA for Micro Probing System

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    PFA for Circuit Edit Probing

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    STA for Scanning Tunneling Microscopy

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    TFA for TEM lamella sample lift out in FIB

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    Probe Head

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    PS series for Photomask Securing

    KN Series for Kleindiek System

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      MICL Group © 

       

        +972-4-8343966


       

      Ha-Tahasia 8 

      Migdal Ha-Emek

      North Israel

      2307041

       

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